Multilayer Reflecting sample using matrix Formula.
Identification
Author: Robert Dalgliesh
Origin: McStas 1.12cb
Date: June 2010
Version: 1.0
Description
**************************************************************
** in order to get this to compile you need to link against
** the gsl and gslcblas libraries.
**
** to do this automatically edit
** /usr/local/lib/mcstas/tools/perl/mcstas_config.perl
**
** add -lgsl and -lgslcblas to the CFLAGS line
**************************************************************
Horizontal reflecting substrate defined by SLDs,Thicknesses, roughnesses
The superphase may also be determined
Example: Multilayer_Sample(xmin=-0.1, xmax=0.1,zmin=-0.1,
zmax=0.1, nlayer=1,sldPar={0.0,2.0e-6,0.0e-6},dPar={20.0},
sigmaPar={5.0,5.0})
Example values: d1 500: sld1 (air) 0.0: sld2 (Si) 2.07e-6:
sldf1(film Ni) 9.1e-6
WARNING: This is a contributed Component.
Input parameters
Parameters in boldface are required;
the others are optional.
Name
Unit
Description
Default
xwidth
m
Width of substrate
0.2
zlength
m
Length of substrate
0.2
nlayer
1
Number of film layers
1
sldPar
1
(Angstoms ^-2) Scattering length Density's of layers
{0.0
dPar
1
(Angstroms) Thicknesses of film layers
{20.0}
sigmaPar
1
(Angstroms) r.m.s roughnesses of the interfaces
{5.0
frac_inc
1
Fraction of statistics to assign to incoherent scattering